Electron Microscopies and Nanoscopies (EMINA)
Gruppo di Lavoro
Facilities of EMINA scanning probe microscopy (SPM) laboratory include a set of three SPM platforms (NT-MDT, Russia), i.e., two atomic force microscopy (AFM) and one scanning tunneling microscopy (STM) setups. In particular, AFM platforms can perform standard morphological characterizations in tapping and contact mode both in air and in liquid, including also the facility for mechanical, electric and magnetic characterizations.
Figure 1: SPM setups available at EMINA: (a) AFM with the facility for mechanical characterizations, (b) AFM which can operate both in air and liquid, (c) STM setup.